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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
complementary metal oxide semiconductor (CMOS)
Semiconductors; Test equipment
A family of integrated circuits characterized by low power consumption.
common mode rejection ratio (CMRR)
Semiconductors; Test equipment
A measure of an instrument's ability to ignore or reject interference from a signal that is common to the instrument's input terminals, but relative to ground. (Expressed in ...
chip mount technology (CMT)
Semiconductors; Test equipment
Any packaging or electronic assembly manufacturing technology, such as TOB, COB, or flip chip, that connects bare (unpackaged) IC chips to the substrate.
capacitance measurement unit (CMU)
Semiconductors; Test equipment
This is a very generic term covering any sort of hardware that can perform capacitance measurement.
cannot duplicate (CND)
Semiconductors; Test equipment
A fault indicated by BIT or other monitoring circuitry which cannot be confirmed at the first level of maintenance.
chip on board (COB)
Semiconductors; Test equipment
A configuration in which a chip is directly attached to a printed circuit board or substrate by solder or conductive adhesives.
chip-on-board (COB)
Semiconductors; Test equipment
A situation where the silicon IC chip is mounted directly to the electronic assembly substrate or PWB without an intermediate packaging step. Connections between the chip and the ...
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
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- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)